20 nm Chemical Batch Sampling Solution with the SLS-20 Syringe Sampler

Siwei Wang, Ph.D., is an Applications Engineer specializing in liquid particle counters and contamination monitoring solutions for high-purity manufacturing processes. With a doctorate in Mechanical Engineering from the University of South Carolina, he brings over a decade of experience in electronics manufacturing, research, and development. Siwei supports global semiconductor and microelectronics customers with process optimization, particle contamination control, and advanced data analysis. He regularly presents on fluid particle monitoring and defect reduction strategies in critical cleanroom environments. At Particle Measuring Systems, a recognized leader in contamination monitoring, Siwei contributes to the development and application of precision liquid particle measurement technologies.

With more than 35 years of technical leadership in liquid particle contamination monitoring, Dwight Beal is recognized globally for advancing contamination control strategies in cleanroom manufacturing. His work has directly influenced how microelectronics and life sciences industries approach sampling accuracy, data reliability, and system validation. A trusted advisor to scientists, engineers, and quality professionals, Dwight is known for delivering high-impact solutions to complex contamination challenges. He has educated industry audiences worldwide through in-depth training on liquid particle counting, data management, and regulatory compliance.